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Si-Pin detector XR-100CR

XR-100CR is a gamma detector with a cooling system based on the Peltier effect. This detector is usually used in laboratory conditions that require medium energy resolution and low count rates. The detector is well suited for X-ray fluorescence analysis, identification of metal alloy markings, detection of lead in paint. 

The maximum cooling temperature is -55 ºС and is controlled by a built-in temperature sensor.

xr100cr_px5

Composition and properties

    • Si-PIN photodiode
    • 2-stage thermoelectric cooler
    • Temperature sensor
    • Beryllium window
    • Multi-channel collimator
    • Sealed housing

xr100t_1

Application

    • XRF analysis
    • Detection of hazardous substances/waste disposal
    • Portable gas analyzers
    • As a component in the production of electronic systems
    • Nuclear medicine
    • Education and Research
    • Art and Archaeology
    • Control of technological processes
    • Mossbauer spectroscopy
    • Space exploration
    • Environmental monitoring
    • Monitoring the state of nuclear power plants
    • Control of harmful emissions

supercr1

Fig. 1. Spectrum of 55 Fe obtained on a 6 mm2 / 500 mm detector.

The resolution for the 5.9 keV 55Fe peak is 145 eV (FWHM) and 230 eV (FWHM) depending on the detector type and choice of time constants.

Options

    • Variable thickness of beryllium window (0.3mm - 7.5 µm).
    • A set of collimators for large flows.
    • Vacuum execution

XR-100CR Specifications

General:

Detector type

Si-PIN

Detector size (sensitive area of the detector)

6 mm2 ( collimated to 4.4 mm2 ) 13
mm2 ( collimated to 11.1 mm2 ) 25
mm2 ( collimated to 21.5 mm2 )

Silicon thickness

500 µm (see efficiency curves)

Collimator

Multilayered

Energy resolution @ 5.9 keV ( 55 Fe)

145 eV (FWHM) and 230 eV (FWHM) depending on the detector type and choice of time constants.

Background

<5 x 10 -3 /s, 2 keV to 150 keV for 6 mm 2 /500 µm detector

Beryllium Window Thickness

1 mil (25 µm), or 0.5 mil (12.5 µm), see transmission curves

Charge sensitive preamplifier

Original Amptek production with high voltage reset

Gain stability

<20 ppm/°C (typical)

Dimensions

7.6 x 4.4 x 2.9 cm (see overall dimensions)

Weight

139 g

Total consumption

<1 W

Warranty period

1 year

Service life

5-10 years, depends on the intensity of use

Working conditions

0°C - +40°C

Storage and transportation

Long term storage: 10+ years in dry place

Standard conditions: -20°C to +50°C, 10 - 90% humidity

TUV Certification
Certificate #: CU 72072412 01
Tested: UL 61010-1: 2004 R7 .05
CAN/CSA-C22.2 61010-1: 2004

Input parameters

Nutrition

Power supply for the XR-100CR detector

9 B

Preamplifier power supply

±8 to 9 V @ 15 mA with no more than 50 mV peak-to-peak noise

Power supply for the XR-100CR detector crystal

+180 V (power supply should be able to produce between +100 to 200 V @ 1 µA) very stable <0.1% variation

Cooler power supply

Current 350mA max, voltage 4V max with <100mV peak-to-peak noise
*XR-100CR includes its own temperature sensor

Output parameters

Output signal

The XR100CR output swings from +5 V to -5 V.
The reset period will vary depending on the detector type and count rate.

Preamplifier sensitivity

1 mV/keV (may vary for different detectors)

Preamplifier polarity

Negative signal output (1kOhm maximum load)

Preamplifier response

Reset by detector capacity

Temperature sensor sensitivity (diode)

770 mV = -50 °C

x123smx123sm oem13oem13
Fig. 2a. Configuration of the X-123, which includes a detector, preamplifier, processor and power supply in a single housing. Fig. 2b. The assembled detector and preamplifier are available as components for electronic systems.

xr100cr_ext

Fig. 3. Modifications of the XR100CR detector

Digital Pulse Processor and Power Supply for XR-100CR

The XR-100CR/PX5 system guarantees stable operation in less than one minute after power is applied.

px5_3

Fig. 4. Block diagram

res_pt

Fig. 5. Resolution versus peak formation time for Si-PIN and SDD detectors

res_icr

Fig. 6. Resolution as a function of count rate for different peak formation times

Efficiency curves

xreff1

Fig. 7. Particle detection efficiency for the XR-100CR detector. 

Due to its unique design and reliability, this detector was chosen for the search mission to analyze Martian rocks.

The first spectrum of a stone from Mars!

barnacle

Fig. 8. The first spectrum from Mars

XRF system based on XR-100CR and Mini-X X-ray tube

system4

Rice. 9. XRF system

mp1_5

Fig. 10. XR100CR and Mini-X on MP1 XRF circuit board

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